Hot-Electron-Induced MOSFET Degradation - Model, Monitor, and Improvement
Chenming Hu(Semiconductor Manufacturing International (Italy)), K.W. Terrill(University of California, Berkeley), Ping-Keung Ko(University of California, Berkeley), Tung-Yi Chan(University of California, Berkeley), Simon Tam(University of California, Berkeley), Fu-Chieh Hsu(University of California, Berkeley)
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