D. M. Tennant, J-M. Verdiell, T. L. Koch et al.|Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena|1992
K. Early, O. R. Wood, D. M. Tennant et al.|Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena|1992