D. M. Tennant, J-M. Verdiell, F. Ostermeyer et al.|Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena|1992
D. M. Tennant, B. Tell, T. L. Koch et al.|Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena|1993