Electrical reliability of tunneling magnetoresistive read headsSeongtae Bae, M. Davis, J.H. Judy et al.|Journal of Applied Physics|2003Cited by 15
Electromigration-induced failure of single layered NiFe Permalloy thin films for a giant magnetoresistive read headSeongtae Bae, Edward S. Murdock, I-Fei Tsu et al.|Journal of Applied Physics|2001Cited by 14
Electromigration study of magnetic thin films for the electrical reliability of spin-valve read headsSeongtae Bae, J.H. Judy, I-Fei Tsu et al.|IEEE Transactions on Magnetics|2002Cited by 12
Dependence of electromigration-induced failure lifetimes on NiFe thin-film thickness in giant magnetoresistive spin-valve read headsSeongtae Bae, Edward S. Murdock, J.H. Judy et al.|Applied Physics Letters|2001Cited by 7
Electromigration of magnetic thin films for predicting electrical-failured lifetime of GMR read headsSeongtae Bae, J.H. Judy, M. Davids et al.|Unknown|2002Cited by 0