Electromigration study of magnetic thin films for the electrical reliability of spin-valve read heads

Seongtae Bae(University of Minnesota), J.H. Judy(University of Minnesota), E. Murdock(Seagate (United States)), I-Fei Tsu(Seagate (United States)), M. Davis(Seagate (United States))
IEEE Transactions on Magnetics
September 1, 2002
Cited by 12


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