Dependence of electromigration-induced failure lifetimes on NiFe thin-film thickness in giant magnetoresistive spin-valve read heads
Seongtae Bae(University of Minnesota), Edward S. Murdock(Seagate (United States)), I-Fei Tsu(Seagate (United States)), M. Davis(Seagate (United States)), J.H. Judy(University of Minnesota)
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