Electromigration of magnetic thin films for predicting electrical-failured lifetime of GMR read heads

Seongtae Bae(University of Minnesota), J.H. Judy(University of Minnesota), E. Murdock(Seagate (United States)), I-Fei Tsu(Seagate (United States)), M. Davids
Unknown
January 1, 2002
Cited by 0


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