Electromigration-induced failure of single layered NiFe Permalloy thin films for a giant magnetoresistive read head

Seongtae Bae(University of Minnesota), Edward S. Murdock(Seagate (United States)), I-Fei Tsu(Seagate (United States)), J.H. Judy(University of Minnesota)
Journal of Applied Physics
September 1, 2001
Cited by 14


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