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Electrical reliability of tunneling magnetoresistive read headsSeongtae Bae, M. Davis, J.H. Judy et al.|Journal of Applied Physics|2003Cited by 15
Electromigration-induced failure of single layered NiFe Permalloy thin films for a giant magnetoresistive read headSeongtae Bae, Edward S. Murdock, J.H. Judy et al.|Journal of Applied Physics|2001Cited by 14
Bottom giant magnetoresistance spin valves using a radio frequency reactive bias-sputtered α-Fe2O3 antiferromagnetic layerSeongtae Bae, P. J. Chen, J.H. Judy et al.|Journal of Applied Physics|2000Cited by 12
Electromigration study of magnetic thin films for the electrical reliability of spin-valve read headsSeongtae Bae, J.H. Judy, I-Fei Tsu et al.|IEEE Transactions on Magnetics|2002Cited by 12