Impact of MOSFET oxide breakdown on digital circuit operation and reliability

B. Kaczer(IMEC), G. Badenes(IMEC), Mahmoud Rasras(IMEC), G. Groeseneken(KU Leuven), R. Degraeve(IMEC), E.P. Vandamme(IMEC), Stefan Kubicek(Austrian Academy of Sciences)
Unknown
November 11, 2002
10.1109/iedm.2000.904379
Cited by 87

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