Microscopic origin of random telegraph noise fluctuations in aggressively scaled RRAM and its impact on read disturb variability
Nagarajan Raghavan(Singapore University of Technology and Design), M. Jurczak(IMEC), A. Fantini(IMEC), R. Degraeve(IMEC), B. Govoreanu(IMEC), Sebastiano Strangio(University of Pisa), Dirk J. Wouters(IMEC), L. Goux(IMEC), G. Groeseneken(KU Leuven)
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