Profile control of novel non-Si gates using BCl3∕N2 plasma

Denis Shamiryan(IMEC), Werner Boullart(IMEC), Salvador Eslava(Imperial College London), M. Demand(IMEC), S. Beckx(Imec the Netherlands), Vasile Paraschiv(IMEC), Mikhaı̈l R. Baklanov(MIREA - Russian Technological University)
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
April 20, 2007
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