K. B. Nguyen, David L. Windt, R. H. Stulen et al.|Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena|1995
K. B. Nguyen, Linus A. Fetter, G. F. Cardinale et al.|Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena|1996