Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components
João Valdoleiros(Universidade do Porto), Lucas F. M. da Silva(Universidade do Porto), Alireza Akhavan‐Safar(Institute of Mechanical Engineering and Industrial Mangement), Payam Maleki(Institute of Mechanical Engineering and Industrial Mangement), Bala Karunamurthy(Siemens (Austria)), Ricardo J. C. Carbas(National Institute of Statistics and Geography), Pedro F. C. Videira(Universidade do Porto), Eduardo A. S. Marques(Universidade do Porto)
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