Nanometer-Scale Oxide Thin Film Transistor with Potential for High-Density Image Sensor Applications

Sanghun Jeon(Korea Advanced Institute of Science and Technology), Changjung Kim(Samsung (South Korea)), Sunil Kim(Yonsei University), Huaxiang Yin(Chinese Academy of Sciences), Eunha Lee(Samsung (South Korea)), Jaechul Park(Samsung (South Korea)), Sungho Park(Samsung (South Korea)), Sang‐Wook Kim(Seoul National University), Hojung Kim(Samsung (South Korea)), Ji‐Hyun Hur(Samsung (South Korea)), Ihun Song(Samsung (South Korea)), U‐In Chung(Samsung (South Korea))
ACS Applied Materials & Interfaces
December 20, 2010
Cited by 79


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