Trap density probing on top-gate MoS <sub>2</sub> nanosheet field-effect transistors by photo-excited charge collection spectroscopy

Kyunghee Choi(Yonsei University), Seongil Im(Yonsei University), Kimoon Lee(Kunsan National University), Kwang H. Lee(Yonsei University), Syed Raza Ali Raza(Yonsei University), Pyo Jin Jeon(Yonsei University), Jin Sung Kim(Yonsei University), Woojin Yoon(Yonsei University), Sung‐Wook Min(Yonsei University), Atiye Pezeshki(Yonsei University), Sang‐Yong Ju(Yonsei University)
Nanoscale
January 1, 2015
Cited by 78


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