Program Trapped-Charge Effect on Random Telegraph-Noise Amplitude in a Planar SONOS Flash Memory Cell
H.C. Ma(National Yang Ming Chiao Tung University), Chih-Yuan Lu(Macronix International (Taiwan)), V. Chen(Macronix International (Taiwan)), S.H. Ku(Macronix International (Taiwan)), Nanzhi Zou(Macronix International (Taiwan)), Wei Lü(Dalian University of Technology), You-Liang Chou(National Yang Ming Chiao Tung University), K.C. Chen(Macronix International (Taiwan)), J.P. Chiu(National Yang Ming Chiao Tung University), Tahui Wang(Macronix International (Taiwan))
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