Advanced Nanoanalysis of a Hf-Based High-k Dielectric Stack Prior to Activation
Mhairi Mackenzie(Urban Big Data Centre), S. McFadzean(University of Glasgow), David W. McComb(The Ohio State University), A. J. Craven(University of Glasgow), F.T. Docherty(Imperial College London), Catriona M. McGilvery(Imperial College London), Stefan De Gendt(Imec the Netherlands)
Cited by 5
Related Papers
Theories of Change and Realistic Evaluation
|Evaluation|2007|376
Electrical properties of high-κ gate dielectrics: Challenges, current issues, and possible solutions
|Materials Science and Engineering R Reports|2006|278
What (or who) causes health inequalities: Theories, evidence and implications?
|Health Policy|2013|186
Structure and composition of silicon-stabilized tricalcium phosphate
|Biomaterials|2002|162