Program charge effect on random telegraph noise amplitude and its device structural dependence in SONOS flash memory
J.P. Chiu(National Yang Ming Chiao Tung University), Chih-Yuan Lu(Macronix International (Taiwan)), S.H. Ku(Macronix International (Taiwan)), Vincent Chen(University of Michigan), Nanzhi Zou(Macronix International (Taiwan)), Wei Lü(Dalian University of Technology), You-Liang Chou(National Yang Ming Chiao Tung University), K.C. Chen(Macronix International (Taiwan)), H.C. Ma(National Yang Ming Chiao Tung University), Tahui Wang(Macronix International (Taiwan))
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