Degradation of Si1−<i>x</i>Ge<i>x</i> epitaxial devices by proton irradiation
H. Ohyama(National Institute of Technology, Kumamoto College), Yoshiya Uwatoko(Tokyo City University), Matty Caymax(IMEC), H. Sunaga(National Institute of Technology, Kumamoto College), I. Nashiyama(Advanced Science Research Center), Y. Takami(Rikkyo University), Jef Poortmans(IMEC), K. Hayama(National Institute of Technology, Kumamoto College), Jan Vanhellemont(IMEC)
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