Germanium content dependence of radiation damage in strained Si/sub 1-x/Ge/sub x/ epitaxial devices
H. Ohyama(National Institute of Technology, Kumamoto College), P. Clauws, Matty Caymax(IMEC), H. Sunaga(National Institute of Technology, Kumamoto College), Y. Takami(Rikkyo University), Jef Poortmans(IMEC), K. Hayama(National Institute of Technology, Kumamoto College), Jan Vanhellemont(IMEC)
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