A model of threading dislocation density in strain-relaxed Ge and GaAs epitaxial films on Si (100)
G. Wang(IMEC), Bart Blanpain(KU Leuven), Roger Loo(IMEC), Marc Heyns(IMEC), Laurent Souriau(IMEC), Matty Caymax(IMEC), Eddy Simoen(IMEC)
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