Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1− x − y Ge x C y alloy layers on Si (100)

A. St. Amour(Princeton University), M. L. W. Thewalt(Simon Fraser University), Y. Lacroix(Simon Fraser University), James C. Sturm(Princeton University), C. W. Liu(Taichung Veterans General Hospital)

Applied Physics Letters

December 25, 1995

Cited by 104

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Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1− <i>x</i> − <i>y</i> Ge <i>x</i> C <i>y</i> alloy layers on Si (100)