Evaluation of the electrical contact area in contact-mode scanning probe microscopy
Umberto Celano(Arizona State University), Wilfried Vandervorst(IMEC), Thierry Conard(IMEC), Guido Giammaria(IMEC), H. Bender(IMEC), Ravi Chandra Chintala(IMEC), Thomas Hantschel(Palo Alto Research Center)
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