Evaluation of the electrical contact area in contact-mode scanning probe microscopyUmberto Celano, Wilfried Vandervorst, Thomas Hantschel et al.|Journal of Applied Physics|2015Cited by 55
Nanoscopic structural rearrangements of the Cu-filament in conductive-bridge memoriesUmberto Celano, W. Vandervorst, Guido Giammaria et al.|Nanoscale|2016Cited by 51