Evaluation of the electrical contact area in contact-mode scanning probe microscopyUmberto Celano, Wilfried Vandervorst, Guido Giammaria et al.|Journal of Applied Physics|2015Cited by 55
Mesoscopic physical removal of material using sliding nano-diamond contactsUmberto Celano, Wilfried Vandervorst, Josephus G. Buijnsters et al.|Scientific Reports|2018Cited by 42
J-Springs - innovative compliant interconnects for next-generation packagingLunyu Ma, Suresh K. Sitaraman, D. K. Fork et al.|Unknown|2003Cited by 38
The enduring legacy of scanning spreading resistance microscopy: Overview, advancements, and future directionsMd Ashiqur Rahman Laskar, Umberto Celano, Pierre Eyben et al.|Applied Physics Reviews|2025Cited by 8