Study of electron and hole injection statistics of BE-SONOS NAND FlashHang-Ting Lue, Chih‐Yuan Lu, M.S. Chen et al.|Unknown|2010Cited by 9
Junction optimization for Reliability issues in floating gate NAND flash cellsChieh-En Lee, Chih-Yuan Lu, I-Chen Yang et al.|Unknown|2011Cited by 7
Cell endurance prediction from a large-area SONOS capacitorChieh-En Lee, C.-Y. Lu, Wei-Hsiang Tu et al.|Unknown|2009Cited by 3
Chip-level reliability study of barrier engineered (BE) floating gate (FG) Flash memory devicesHang-Ting Lue, Chih-Yuan Lu, JiFong Pan et al.|Unknown|2010Cited by 1