Junction optimization for Reliability issues in floating gate NAND flash cells
Chieh-En Lee(Macronix International (Taiwan)), Chih-Yuan Lu(Macronix International (Taiwan)), Jen-Wei Huang(Macronix International (Taiwan)), Chienying Lee(Macronix International (Taiwan)), K. F. Chen(Macronix International (Taiwan)), Tahui Wang(Macronix International (Taiwan)), S.H. Ku(Macronix International (Taiwan)), M. S. Chen(Macronix International (Taiwan)), I. J. Huang(National Taiwan Ocean University), K. C. Chen(Macronix International (Taiwan)), Wei Lü(Dalian University of Technology), I-Chen Yang(Macronix International (Taiwan)), T. T. Han(Minghsin University of Science and Technology), C.H. Cheng(Macronix International (Taiwan)), L. H. Chong(Macronix International (Taiwan)), N. K. Zous(Macronix International (Taiwan))
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