Study of electron and hole injection statistics of BE-SONOS NAND Flash

Hang-Ting Lue(Macronix International (Taiwan)), Chih‐Yuan Lu(Macronix International (Taiwan)), K. F. Chen(Minghsin University of Science and Technology), Y. J. Chen(Minghsin University of Science and Technology), I. J. Huang(National Taiwan Ocean University), Wei Lü(Dalian University of Technology), Tzu‐Hsuan Hsu(Macronix International (Taiwan)), Chester Lo(Minghsin University of Science and Technology), C.S. Chang(Minghsin University of Science and Technology), T. T. Han(Minghsin University of Science and Technology), Sheng-Chih Lai(Macronix International (Taiwan)), Ming Liaw(Minghsin University of Science and Technology), K. C. Chen(Minghsin University of Science and Technology), Kuang-Yeu Hsieh(Macronix International (Taiwan)), M.S. Chen(Minghsin University of Science and Technology)
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January 1, 2010
Cited by 9


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