A review of Ga2O3 materials, processing, and devicesS. J. Pearton, Michael A. Mastro, Jihyun Kim et al.|Applied Physics Reviews|2018Cited by 3k
Perspective: Ga2O3 for ultra-high power rectifiers and MOSFETSS. J. Pearton, Jihyun Kim, F. Ren et al.|Journal of Applied Physics|2018Cited by 633
Perspective—Opportunities and Future Directions for Ga<sub>2</sub>O<sub>3</sub>Michael A. Mastro, S. J. Pearton, Akito Kuramata et al.|ECS Journal of Solid State Science and Technology|2017Cited by 475
Radiation damage effects in Ga<sub>2</sub>O<sub>3</sub> materials and devicesJihyun Kim, A. Y. Polyakov, S. J. Pearton et al.|Journal of Materials Chemistry C|2018Cited by 267
Review of radiation damage in GaN-based materials and devicesS. J. Pearton, Jihyun Kim, Richard Deist et al.|Journal of Vacuum Science & Technology A Vacuum Surfaces and Films|2013Cited by 235