Layer-controlled epitaxy of 2D semiconductors: bridging nanoscale phenomena to wafer-scale uniformityDaniele Chiappe, Iuliana Radu, Umberto Celano et al.|Nanotechnology|2018Cited by 61
Dopant, composition and carrier profiling for 3D structuresWilfried Vandervorst, A. Budrevich, Claudia Fleischmann et al.|Materials Science in Semiconductor Processing|2016Cited by 46
Mesoscopic physical removal of material using sliding nano-diamond contactsUmberto Celano, Wilfried Vandervorst, Thomas Hantschel et al.|Scientific Reports|2018Cited by 42