Layer-controlled epitaxy of 2D semiconductors: bridging nanoscale phenomena to wafer-scale uniformity
Daniele Chiappe(IMEC), Iuliana Radu(IMEC), Salim El Kazzi(IMEC), Cedric Huyghebaert(IMEC), Inge Asselberghs(IMEC), Alessandra Leonhardt(IMEC), Thomas Nuytten(IMEC), Umberto Celano(Arizona State University), Wilfried Vandervorst(Imec the Netherlands), Matty Caymax(IMEC), Surajit Sutar(IMEC), Stefan De Gendt(Imec the Netherlands), Geoffrey Pourtois(IMEC), Kristof Paredis(IMEC), Dennis Lin(IMEC), Jonathan Ludwig(IMEC), Kathy Barla(IMEC), Ankit Nalin Mehta(IMEC)
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