Temperature dependence of DTMOS transistor characteristicsJae-Ki Lee, Jong‐Tae Park, Nag-Jong Choi et al.|Solid-State Electronics|2003Cited by 15
Hot carrier-induced SOI MOSFET degradation under AC stress conditionsJae-Ki Lee, Jong‐Tae Park, Nag-Jong Choi et al.|IEEE Electron Device Letters|2002Cited by 9
Temperature dependence of hot-carrier degradation in silicon-on-insulator dynamic threshold voltage MOS transistorsJae-Ki Lee, Jong‐Tae Park, Nag-Jong Choi et al.|IEEE Electron Device Letters|2002Cited by 8