Hot carrier-induced SOI MOSFET degradation under AC stress conditions

Jae-Ki Lee(Korea Electrotechnology Research Institute), Jong‐Tae Park(Flex (United States)), Chong-Gun Yu(Incheon National University), Jean-Pierre Colinge(University of California, Davis), Nag-Jong Choi(Incheon National University), Yun-Bong Hyun(Incheon National University)
IEEE Electron Device Letters
March 1, 2002
10.1109/55.988823
Cited by 9

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