Temperature dependence of DTMOS transistor characteristics
Jae-Ki Lee(Korea Electrotechnology Research Institute), Jong‐Tae Park(Flex (United States)), Chong-Gun Yu(Incheon National University), Nag-Jong Choi(Incheon National University), Jean-Pierre Colinge(Commissariat à l'Énergie Atomique et aux Énergies Alternatives)
Cited by 15
Related Papers
Multiple-gate SOI MOSFETs: device design guidelines
|IEEE Transactions on Electron Devices|2002|485
Evolution of recrystallization texture in nonoriented electrical steels
|Acta Materialia|2003|340
Pi-Gate SOI MOSFET
|IEEE Electron Device Letters|2001|257
FAM83H Mutations in Families with Autosomal-Dominant Hypocalcified Amelogenesis Imperfecta
|The American Journal of Human Genetics|2008|190
Extraordinary Off-Stoichiometric Bismuth Telluride for Enhanced n-Type Thermoelectric Power Factor
|Journal of the American Chemical Society|2016|113