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Evolution of Defect States within the Band Gap of Indium–Tin–Zinc Oxide Thin Film Transistors Using the Quantitative Defect Analysis MethodDong Yeob Shin, Kwun‐Bum Chung, Min Jung Kim et al.|ACS Applied Electronic Materials|2025Cited by 5
Thermally Stable and Shape‐Adaptive Triboelectric Nanogenerators Based on Liquid Electrolytes with Low Vapor PressureTeklebrahan Gebrekrstos Weldemhret, Yong Tae Park, Kwun‐Bum Chung et al.|Small|2025Cited by 2
Evaluation of the high mobility and stability of InGaZnO/InSnZnO bilayer thin-film transistors via quantitative defect analysisTeklebrahan Gebrekrstos Weldemhret, Kwun‐Bum Chung, Dong‐Joon Yi et al.|Surfaces and Interfaces|2025Cited by 2
Clay/Conjugated Polymer Functional Coatings for High-Temperature-Operable and Wide-Range Foam Piezoresistive SensorsTeklebrahan Gebrekrstos Weldemhret, Kwun‐Bum Chung, Yong Tae Park et al.|ACS Applied Polymer Materials|2025Cited by 0