Quantitative Insight of Annealing Atmosphere-Induced Device Performance and Bias Stability in a Ga-Doped InZnSnO Thin-Film Transistors
Nayoung Choi(Dongguk University), Kwun‐Bum Chung(Dongguk University), Kwangsik Jeong(Yonsei University), Min Jung Kim(Dongguk University), Dong Yeob Shin(Dongguk University), Teklebrahan Gebrekrstos Weldemhret(Dongguk University), Jinyoung Go(Dongguk University), Hyunmin Hong(Dongguk University)
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