Quantitative Insight of Annealing Atmosphere-Induced Device Performance and Bias Stability in a Ga-Doped InZnSnO Thin-Film Transistors

Nayoung Choi(Dongguk University), Kwun‐Bum Chung(Dongguk University), Kwangsik Jeong(Yonsei University), Min Jung Kim(Dongguk University), Dong Yeob Shin(Dongguk University), Teklebrahan Gebrekrstos Weldemhret(Dongguk University), Jinyoung Go(Dongguk University), Hyunmin Hong(Dongguk University)
IEEE Transactions on Electron Devices
July 18, 2024
Cited by 9


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