Properties of titanium oxide films obtained by PECVDNilson Cristino da Cruz, Mário A. Bica de Moraes, B. C. Trasferetti et al.|Surface and Coatings Technology|2000Cited by 47
Berreman effect applied to phase characterization of thin films supported on metallic substrates: The case of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">TiO</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>B. C. Trasferetti, Mário A. Bica de Moraes, Celso U. Davanzo et al.|Physical review. B, Condensed matter|2001Cited by 37
Observation of the Berreman Effect in Infrared Reflection-Absorption Spectra of Amorphous Titanium Oxide Thin Films Deposited on AluminumB. C. Trasferetti, Mário A. Bica de Moraes, Celso U. Davanzo et al.|Applied Spectroscopy|2000Cited by 16
The effect of ion bombardment on the properties of TiO films deposited by a modified ion-assisted PECVD techniqueNilson Cristino da Cruz, Celso U. Davanzo, B. C. Trasferetti et al.|Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms|2001Cited by 6