Berreman effect applied to phase characterization of thin films supported on metallic substrates: The case of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">TiO</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>
B. C. Trasferetti(Universidade Estadual de Campinas (UNICAMP)), Mário A. Bica de Moraes(Universidade Estadual de Campinas (UNICAMP)), Rita Aparecida Zoppi(Universidade Estadual de Campinas (UNICAMP)), Celso U. Davanzo(Universidade Estadual de Campinas (UNICAMP)), Nilson Cristino da Cruz(Universidade de Sorocaba)
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