Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO<sub>2</sub>(Ti)/SiO<sub>2</sub>/Si stacksЕ. О. Филатова, F. Schäfers, S. A. Yulin et al.|Science and Technology of Advanced Materials|2012Cited by 26
X-ray and photoelectron spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO3 based heterostucturesЕ. О. Филатова, A. S. Shulakov, I. V. Kozhevnikov et al.|Microelectronic Engineering|2013Cited by 3