X-ray and photoelectron spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO3 based heterostuctures

Е. О. Филатова(St Petersburg University), A. S. Shulakov(St Petersburg University), O. Yu. Vilkov(St Petersburg University), Yu.V. Yegorova(St Petersburg University), Franz Schaefers, I. V. Kozhevnikov(A.V. Shubnikov Institute of Crystallography), Mihaela Gorgoi(Helmholtz-Zentrum Berlin für Materialien und Energie), Aleksei S. Konashuk(St Petersburg University), Andréy Sokolov(St Petersburg University)
Microelectronic Engineering
March 26, 2013
Cited by 3


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