Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO<sub>2</sub>(Ti)/SiO<sub>2</sub>/Si stacksЕ. О. Филатова, F. Schäfers, Е. В. Убыйвовк et al.|Science and Technology of Advanced Materials|2012Cited by 26
X-ray spectroscopic study of SrTiOx films with different interlayersЕ. О. Филатова, А. А. Павлычев, Andréy Sokolov et al.|Journal of Applied Physics|2013Cited by 15
X-ray and photoelectron spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO3 based heterostucturesЕ. О. Филатова, A. S. Shulakov, Mihaela Gorgoi et al.|Microelectronic Engineering|2013Cited by 3