In-Situ Monitoring Solder Layer Degradation in Multichip IGBT Power Modules Using Auxiliary Emitter VoltageJianxiong Yang, Mingxing Du, Yanbo Che et al.|IEEE Transactions on Power Electronics|2024Cited by 7
Short-circuit and open-circuit faults monitoring of IGBTs in solid-state-transformers using collector-emitter voltageYaoyao Men, Yanbo Che, Jianxiong Yang et al.|Journal of Power Electronics|2021Cited by 6
In Situ Monitoring Chip Failure in Multichip IGBT Modules Using Turn-On Delay Time Extracted From Auxiliary Emitter VoltageJianxiong Yang, Yijing Chen, Yanbo Che et al.|IEEE Journal of Emerging and Selected Topics in Power Electronics|2024Cited by 6
In Situ Monitoring of Maximum and Average Chip Junction Temperature Within Multichip IGBT Power Modules Using Kelvin Emitter VoltageJianxiong Yang, Mingxing Du, Yanbo Che et al.|IEEE Journal of Emerging and Selected Topics in Power Electronics|2025Cited by 2