In Situ Monitoring Chip Failure in Multichip IGBT Modules Using Turn-On Delay Time Extracted From Auxiliary Emitter Voltage
Jianxiong Yang(Tianjin University of Technology), Yijing Chen(Huaneng Clean Energy Research Institute), Yanbo Che(Tianjin University), Li Ran(Durham University), Xiaojiang Guo(Huaneng Clean Energy Research Institute)
IEEE Journal of Emerging and Selected Topics in Power Electronics
March 25, 2024
Cited by 6
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