Terahertz Micromachined On-Wafer Probes: Repeatability and ReliabilityLihan Chen, N. Scott Barker, Chunhu Zhang et al.|IEEE Transactions on Microwave Theory and Techniques|2012Cited by 39
A 1.1 THz micromachined on-wafer probeMatthew F. Bauwens, Robert M. Weikle, Naser Alijabbari et al.|Unknown|2014Cited by 38
Improved Micromachined Terahertz On-Wafer Probe Using Integrated Strain SensorQiang Yu, N. Scott Barker, Matthew F. Bauwens et al.|IEEE Transactions on Microwave Theory and Techniques|2013Cited by 23
A W-Band Micromachined On-Wafer Probe With Integrated Balun for Characterization of Differential CircuitsChunhu Zhang, Arthur W. Lichtenberger, Matthew F. Bauwens et al.|IEEE Transactions on Microwave Theory and Techniques|2016Cited by 22
Silicon-on-Insulator Substrates as a Micromachining Platform for Advanced Terahertz CircuitsN. Scott Barker, Robert M. Weikle, Matthew F. Bauwens et al.|Proceedings of the IEEE|2016Cited by 20