Terahertz Micromachined On-Wafer Probes: Repeatability and Reliability
Lihan Chen(University of Virginia), N. Scott Barker(University of Virginia), Matthew F. Bauwens(University of Virginia), Theodore Reck(Virginia Diodes (United States)), Christopher Groppi, Chunhu Zhang(University of Virginia), Robert M. Weikle(Microprobes (United States)), Alex Arsenovic(University of Virginia), Arthur W. Lichtenberger(University of Virginia)
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