Improved Micromachined Terahertz On-Wafer Probe Using Integrated Strain Sensor

Qiang Yu(Fudan University), N. Scott Barker(University of Virginia), Robert M. Weikle(Microprobes (United States)), Arthur W. Lichtenberger(University of Virginia), Matthew F. Bauwens(University of Virginia), Chunhu Zhang(University of Virginia)
IEEE Transactions on Microwave Theory and Techniques
December 1, 2013
Cited by 23


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