PSO-Based Optimal Coverage Path Planning for Surface Defect Inspection of 3C Components With a Robotic Line Scanner

Hongpeng Chen(Hong Kong Polytechnic University), David Navarro-Alarcón(Hong Kong Polytechnic University), Shengzeng Huo(Hong Kong Polytechnic University), Hoi-Yin Lee(Hong Kong Polytechnic University), Anqing Duan(Mohamed bin Zayed University of Artificial Intelligence), Pai Zheng(Hong Kong Polytechnic University), Muhammad Muddassir(Hong Kong Polytechnic University), Junxi Li(Hong Kong Polytechnic University), Yuli Liu(University of Macau)
IEEE Transactions on Instrumentation and Measurement
January 1, 2025
Cited by 10


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