Optimizing electrical AFM probing for 2D materials: The crucial role of tip-sample electrical interactions and back contact configurations
Md Ashiqur Rahman Laskar(Arizona State University), Umberto Celano(Arizona State University), Pinaka Pani Tummala(Semiconductor Manufacturing International (Italy)), Alessio Lamperti(Semiconductor Manufacturing International (Italy)), Alessandro Molle, Valeri Afanas’ev(IMEC), S. Amir Ghoreishi(Arizona State University), Srijan Chakrabarti(Arizona State University), S.M. Masum Ahmed(Arizona State University)
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