Optimizing electrical AFM probing for 2D materials: The crucial role of tip-sample electrical interactions and back contact configurationsMd Ashiqur Rahman Laskar, Umberto Celano, Alessandro Molle et al.|Materials Science in Semiconductor Processing|2024Cited by 7
A Pathway for Electron Beam-Assisted Back-Contact Free Electrical Atomic Force MicroscopyMd Ashiqur Rahman Laskar, Umberto Celano, Anacleto Proietti et al.|Proceedings - International Symposium for Testing and Failure Analysis|2025Cited by 0